Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM Ray F. Egerton

By: Ray F. EgertonMaterial type: TextTextLanguage: English Publication details: USA Springer 2005Edition: 1st edDescription: 196ISBN: 0387258000Subject(s): DDC classification: 573
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Book Cart 		570 - 579 573 Cut E 29 (Browse shelf(Opens below)) Available 0000004684
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